Sensor

ON Semiconductor's C-Series silicon photomultiplier (SiPM) sensors feature an industry-leading low dark count rate of 30 kHz/mm2 and excellent breakdown voltage uniformity of ±250 mV. High Photon Detection Efficiency (PDE) extends into the blue part of the spectrum using a high-volume CMOS process. The C-Series sensors are available in 1 mm, 3 mm and 6 mm sizes as well as a variety of microcell sizes. These devices are housed in a tileable moldable leadframe (MLP) package that is compatible with industry standard, leadless, reflow soldering processes. The C-Series also features a unique fast output for fast timing applications.

The ultrasonic distance measurement module uses the ultrasonic measurement principle to calculate the distance between the object and the ultrasonic wave according to the time difference between transmitting the ultrasonic wave and receiving the ultrasonic wave