The 3KASMC17HE3/57T is a high-performance TVS (transient voltage suppressor) diode designed to protect sensitive electronic equipment from voltage transients induced by lightning, ESD (electrostatic discharge), and other transient voltage events. This entry provides a comprehensive overview of the product, including its basic information, specifications, pin configuration, functional features, advantages and disadvantages, working principles, application field plans, and alternative models.
The 3KASMC17HE3/57T TVS diode typically features two pins, with the anode and cathode connections for easy integration into electronic circuits.
The 3KASMC17HE3/57T operates by diverting excessive transient current away from sensitive electronic components, thereby limiting the voltage across the protected circuit. When a transient event occurs, the diode rapidly conducts, shunting the excess energy to ground and safeguarding the connected electronics.
The 3KASMC17HE3/57T is widely used in various applications, including: - Consumer electronics - Telecommunications equipment - Industrial automation systems - Automotive electronics - Renewable energy systems
Alternative Model 1: 5KASMC20HE3/57T
Alternative Model 2: 8KASMC24HE3/57T
In summary, the 3KASMC17HE3/57T TVS diode offers robust transient voltage protection with its high surge capability, low clamping voltage, and fast response time. Its application spans across diverse industries, and it can be complemented by alternative models with varying specifications to suit specific requirements.
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What is 3KASMC17HE3/57T?
What is the maximum clamping voltage of 3KASMC17HE3/57T?
What is the peak pulse power dissipation of 3KASMC17HE3/57T?
What are the typical applications of 3KASMC17HE3/57T?
What is the operating temperature range of 3KASMC17HE3/57T?
What is the package type of 3KASMC17HE3/57T?
Does 3KASMC17HE3/57T comply with RoHS requirements?
What are the key features of 3KASMC17HE3/57T?
What are the recommended soldering conditions for 3KASMC17HE3/57T?
Is 3KASMC17HE3/57T suitable for high-reliability applications?